Y. Chang, Minsu Choi, Nohpill Park, Fabrizio Lombardi. Repairability Evaluation of Embedded Multiple Region DRAMs. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 428-436, IEEE Computer Society, 2002. [doi]
Abstract is missing.