Radiation-hardened library cell template and its total ionizing dose (TID) delay characterization in 65nm CMOS process

Joseph S. Chang, Kwen-Siong Chong, Wei Shu, Tong Lin, Jize Jiang, Ne Kyaw Zwa Lwin, Yang Kang. Radiation-hardened library cell template and its total ionizing dose (TID) delay characterization in 65nm CMOS process. In IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014. pages 821-824, IEEE, 2014. [doi]

Abstract

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