Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler. Test cost reduction through performance prediction using virtual probe. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-9, IEEE, 2011. [doi]
Abstract is missing.