Hsiu-Ming (Sherman) Chang, Min-Sheng (Mitchell) Lin, Kwang-Ting (Tim) Cheng. Digitally-Assisted Analog/RF Testing for Mixed-Signal SoCs. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 43-48, IEEE Computer Society, 2008. [doi]
Abstract is missing.