A SAR ADC BIST for simplified linearity test

An-Sheng Chao, Soon-Jyh Chang, Hsin-Wen Ting. A SAR ADC BIST for simplified linearity test. In IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, September 26-28, 2011. pages 146-149, IEEE, 2011. [doi]

Abstract

Abstract is missing.