Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren. Relating digital imager defect rates to pixel size, sensor area and ISO. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 164-169, IEEE Computer Society, 2012. [doi]
Abstract is missing.