Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren. Improved image accuracy in Hot Pixel degraded digital cameras. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 172-177, IEEE, 2013. [doi]
Abstract is missing.