Athanasios Chatzidimitriou, Manolis Kaliorakis, Dimitris Gizopoulos, Maurizio Iacaruso, Mauro Pipponzi, Riccardo Mariani, Stefano Di Carlo. RT Level vs. Microarchitecture-Level Reliability Assessment: Case Study on ARM(R) Cortex(R)-A9 CPU. In 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN Workshops 2017, Denver, CO, USA, June 26-29, 2017. pages 117-120, IEEE Computer Society, 2017. [doi]
Abstract is missing.