Accurate Leakage/Delay Estimation for FinFET Standard Cells under PVT Variations using the Response Surface Methodology

Sourindra M. Chaudhuri, Prateek Mishra, Niraj K. Jha. Accurate Leakage/Delay Estimation for FinFET Standard Cells under PVT Variations using the Response Surface Methodology. JETC, 11(2):19, 2014. [doi]

Abstract

Abstract is missing.