A New Device for In Situ Measurement of an Impedance Profile at 1-20 MHz

Xavier Chavanne, Jean-Pierre Frangi, Gilles de Rosny. A New Device for In Situ Measurement of an Impedance Profile at 1-20 MHz. IEEE T. Instrumentation and Measurement, 59(7):1850-1859, 2010. [doi]

Authors

Xavier Chavanne

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Jean-Pierre Frangi

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Gilles de Rosny

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