A New Device for In Situ Measurement of an Impedance Profile at 1-20 MHz

Xavier Chavanne, Jean-Pierre Frangi, Gilles de Rosny. A New Device for In Situ Measurement of an Impedance Profile at 1-20 MHz. IEEE T. Instrumentation and Measurement, 59(7):1850-1859, 2010. [doi]

@article{ChavanneFR10,
  title = {A New Device for In Situ Measurement of an Impedance Profile at 1-20 MHz},
  author = {Xavier Chavanne and Jean-Pierre Frangi and Gilles de Rosny},
  year = {2010},
  doi = {10.1109/TIM.2009.2028781},
  url = {http://dx.doi.org/10.1109/TIM.2009.2028781},
  researchr = {https://researchr.org/publication/ChavanneFR10},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {59},
  number = {7},
  pages = {1850-1859},
}