Kaibai Chen. The Main Damage Characteristics of Semiconductor Devices Under High-Power Microwave. In Qilian Liang, Xin Liu 0009, Zhenyu Na, Wei Wang 0180, Jiasong Mu, Baoju Zhang, editors, Communications, Signal Processing, and Systems - Proceedings of the 2018 CSPS, Volume III: Systems, Dalian, China, 14-16 July 2018. Volume 517 of Lecture Notes in Electrical Engineering, pages 558-563, Springer, 2018. [doi]
Abstract is missing.