Shih-Hung Chen. Esd Challenges in Advanced Finfet and Gaa Nanowire cmos Technologies: Designing Diode Based ESD Protection in Advanced State of the Art Technologies. In IEEE Custom Integrated Circuits Conference, CICC 2019, Austin, TX, USA, April 14-17, 2019. pages 1-100, IEEE, 2019. [doi]
Abstract is missing.