Shih-Hung Chen. Esd Challenges in Advanced Finfet and Gaa Nanowire cmos Technologies: Designing Diode Based ESD Protection in Advanced State of the Art Technologies. In IEEE Custom Integrated Circuits Conference, CICC 2019, Austin, TX, USA, April 14-17, 2019. pages 1-100, IEEE, 2019. [doi]
@inproceedings{Chen19-74,
title = {Esd Challenges in Advanced Finfet and Gaa Nanowire cmos Technologies: Designing Diode Based ESD Protection in Advanced State of the Art Technologies},
author = {Shih-Hung Chen},
year = {2019},
doi = {10.1109/CICC.2019.8780136},
url = {https://doi.org/10.1109/CICC.2019.8780136},
researchr = {https://researchr.org/publication/Chen19-74},
cites = {0},
citedby = {0},
pages = {1-100},
booktitle = {IEEE Custom Integrated Circuits Conference, CICC 2019, Austin, TX, USA, April 14-17, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9395-7},
}