Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores - researchr publication

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Li Chen, Xiaoliang Bai, Sujit Dey. Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 317-320, ACM, 2001. [doi]

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