Architectural evaluations on TSV redundancy for reliability enhancement

Yen-Hao Chen, Chien-Pang Chiu, Russell Barnes, TingTing Hwang. Architectural evaluations on TSV redundancy for reliability enhancement. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 566-571, IEEE, 2017. [doi]

Abstract

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