Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology

Hsin-Chieh Chen, Wei-Chung Chen, Ying-Wei Chou, Meng-Wei Chien, Chin-Long Wey, Ke-Horng Chen, Ying-Hsi Lin, Tsung-Yen Tsai, Chao-Cheng Lee. Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]

Authors

Hsin-Chieh Chen

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Wei-Chung Chen

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Ying-Wei Chou

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Meng-Wei Chien

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Chin-Long Wey

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Ke-Horng Chen

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Ying-Hsi Lin

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Tsung-Yen Tsai

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Chao-Cheng Lee

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