Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology

Hsin-Chieh Chen, Wei-Chung Chen, Ying-Wei Chou, Meng-Wei Chien, Chin-Long Wey, Ke-Horng Chen, Ying-Hsi Lin, Tsung-Yen Tsai, Chao-Cheng Lee. Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]

@inproceedings{ChenCCCWCLTL14,
  title = {Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology},
  author = {Hsin-Chieh Chen and Wei-Chung Chen and Ying-Wei Chou and Meng-Wei Chien and Chin-Long Wey and Ke-Horng Chen and Ying-Hsi Lin and Tsung-Yen Tsai and Chao-Cheng Lee},
  year = {2014},
  doi = {10.1109/CICC.2014.6946134},
  url = {http://dx.doi.org/10.1109/CICC.2014.6946134},
  researchr = {https://researchr.org/publication/ChenCCCWCLTL14},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014},
  publisher = {IEEE},
}