Ming Chen, Yun Chen, Bingsen Chen, Qun Wang. Analysis on Product Technical Risk with Bayesian Belief Networks. In Kesheng Wang, George L. Kovács, Michael J. Wozny, Minglun Fang, editors, Knowledge Enterprise: Intelligent Strategies in Product Design, Manufacturing, and Management, Proceedings of PROLAMAT 2006, IFIP TC5 International Conference, June 15-17, 2006, Shanghai, China. Volume 207 of IFIP, pages 244-249, Springer, 2006. [doi]
@inproceedings{ChenCCW06,
title = {Analysis on Product Technical Risk with Bayesian Belief Networks},
author = {Ming Chen and Yun Chen and Bingsen Chen and Qun Wang},
year = {2006},
doi = {10.1007/0-387-34403-9_33},
url = {http://dx.doi.org/10.1007/0-387-34403-9_33},
tags = {analysis},
researchr = {https://researchr.org/publication/ChenCCW06},
cites = {0},
citedby = {0},
pages = {244-249},
booktitle = {Knowledge Enterprise: Intelligent Strategies in Product Design, Manufacturing, and Management, Proceedings of PROLAMAT 2006, IFIP TC5 International Conference, June 15-17, 2006, Shanghai, China},
editor = {Kesheng Wang and George L. Kovács and Michael J. Wozny and Minglun Fang},
volume = {207},
series = {IFIP},
publisher = {Springer},
isbn = {0-387-34402-0},
}