Chien-Ju Chen, Yin-Nien Chen, Ming-Long Fan, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang. Evaluation of TFET and FinFET devices and 32-Bit CLA circuits considering work function variation and line-edge roughness. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2325-2328, IEEE, 2015. [doi]
Abstract is missing.