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Evaluation of TFET and FinFET devices and 32-Bit CLA circuits considering work function variation and line-edge roughness

Chien-Ju Chen, Yin-Nien Chen, Ming-Long Fan, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang. Evaluation of TFET and FinFET devices and 32-Bit CLA circuits considering work function variation and line-edge roughness. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2325-2328, IEEE, 2015. [doi]

Authors

Chien-Ju Chen

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Yin-Nien Chen

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Ming-Long Fan

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Vita Pi-Ho Hu

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Pin Su

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Ching-Te Chuang

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