Chien-Ju Chen, Yin-Nien Chen, Ming-Long Fan, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang. Evaluation of TFET and FinFET devices and 32-Bit CLA circuits considering work function variation and line-edge roughness. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 2325-2328, IEEE, 2015. [doi]
@inproceedings{ChenCFHSC15,
title = {Evaluation of TFET and FinFET devices and 32-Bit CLA circuits considering work function variation and line-edge roughness},
author = {Chien-Ju Chen and Yin-Nien Chen and Ming-Long Fan and Vita Pi-Ho Hu and Pin Su and Ching-Te Chuang},
year = {2015},
doi = {10.1109/ISCAS.2015.7169149},
url = {http://dx.doi.org/10.1109/ISCAS.2015.7169149},
researchr = {https://researchr.org/publication/ChenCFHSC15},
cites = {0},
citedby = {0},
pages = {2325-2328},
booktitle = {2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8391-9},
}