DEFUSE: A Deterministic Functional Self-Test Methodology for Processors

Li Chen, Sujit Dey. DEFUSE: A Deterministic Functional Self-Test Methodology for Processors. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 255-262, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.