Po-Juei Chen, Wei-Li Hsu, James Chien-Mo Li, Nan-Hsin Tseng, Kuo-Yin Chen, Wei-pin Changchien, Charles C. C. Liu. An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay Defects. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 291-296, IEEE Computer Society, 2011. [doi]
Abstract is missing.