Data-Driven Test Plan Augmentation for Platform Verification

Wen Chen, Kuo-Kai Hsieh, Li-Chung Wang, Jayanta Bhadra. Data-Driven Test Plan Augmentation for Platform Verification. IEEE Design & Test of Computers, 34(5):23-29, 2017. [doi]

Authors

Wen Chen

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Kuo-Kai Hsieh

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Li-Chung Wang

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Jayanta Bhadra

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