Huamei Chen, John M. Irvine, Zhonghai Wang, Genshe Chen, Erik Blasch, James Nagy. Predicting Interpretability Loss in Thermal IR Imagery due to Compression. In 47th IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2018, Washington, DC, USA, October 9-11, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.