Haowen Chen, Xiao-Yuan Jing, Baowen Xu. Heterogeneous Defect Prediction through Joint Metric Selection and Matching. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021, Hainan, China, December 6-10, 2021. pages 367-377, IEEE, 2021. [doi]
Abstract is missing.