Interconnect thermal modeling for determining design limits on current density

Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang. Interconnect thermal modeling for determining design limits on current density. In ISPD. pages 172-178, 1999. [doi]

Authors

Danqing Chen

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Erhong Li

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Elyse Rosenbaum

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Sung-Mo Kang

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