J. S. Chen, Y. S. Moon. A Statistical Evaluation Model for Minutiae-Based Automatic Fingerprint Verification Systems. In David Zhang, Anil K. Jain, editors, Advances in Biometrics, International Conference, ICB 2006, Hong Kong, China, January 5-7, 2006, Proceedings. Volume 3832 of Lecture Notes in Computer Science, pages 236-243, Springer, 2006. [doi]