Qikai Chen, Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy. Process Variation Tolerant Online Current Monitor for Robust Systems. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 171-176, IEEE Computer Society, 2005. [doi]
Abstract is missing.