Xiaoran Chen, Paraskevi Nousi, Mike Boss, Michele Volpi, Lukas Roth. Comparative Analysis of Image-Based Deep Learning and Genomic Models for Yield and Protein Content Prediction in Winter Wheat. In IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Workshops, Honolulu, HI, USA, October 19-20, 2025. pages 7178-7186, IEEE, 2025. [doi]
Abstract is missing.