Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay Test

Mingjing Chen, Alex Orailoglu. Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay Test. IEEE Trans. VLSI Syst., 22(4):734-746, 2014. [doi]

Abstract

Abstract is missing.