Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors

Zhen Chen, Ershun Pan, Tangbin Xia, Yanting Li. Optimal degradation-based burn-in policy using Tweedie exponential-dispersion process model with measurement errors. Rel. Eng. & Sys. Safety, 195:106748, 2020. [doi]

Abstract

Abstract is missing.