An Ultra-Large Capacity Single-Chip Memory Architecture With Self-Testing and Self-Repairing

Tom Chen, Glen Sunada. An Ultra-Large Capacity Single-Chip Memory Architecture With Self-Testing and Self-Repairing. In Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 92, Cambridge, MA, USA, October 11-14, 1992. pages 576-581, IEEE Computer Society, 1992.

Abstract

Abstract is missing.