Architectural analyses of K-Means silicon intellectual property for image segmentation

Tse-Wei Chen, Chih-Hao Sun, Jun-Ying Bai, Han-Ru Chen, Shao-Yi Chien. Architectural analyses of K-Means silicon intellectual property for image segmentation. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 2578-2581, IEEE, 2008. [doi]

Abstract

Abstract is missing.