A comprehensive approach to modeling, characterizing and optimizing for metastability in FPGAs

Doris Chen, Deshanand Singh, Jeffrey Chromczak, David M. Lewis, Ryan Fung, David Neto, Vaughn Betz. A comprehensive approach to modeling, characterizing and optimizing for metastability in FPGAs. In Peter Y. K. Cheung, John Wawrzynek, editors, Proceedings of the ACM/SIGDA 18th International Symposium on Field Programmable Gate Arrays, FPGA 2010, Monterey, California, USA, February 21-23, 2010. pages 167-176, ACM, 2010. [doi]

Abstract

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