Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation

Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu 0001. Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(7):1990-2003, 2022. [doi]

Abstract

Abstract is missing.