Hai-Bao Chen, Sheldon X.-D. Tan, Valeriy Sukharev, Xin Huang, Taeyoung Kim. Interconnect reliability modeling and analysis for multi-branch interconnect trees. In Proceedings of the 52nd Annual Design Automation Conference, San Francisco, CA, USA, June 7-11, 2015. pages 90, ACM, 2015. [doi]
Abstract is missing.