Fast Analytic Electromigration Analysis for General Multisegment Interconnect Wires

Liang Chen, Sheldon X.-D. Tan, Zeyu Sun, Shaoyi Peng, Min Tang, Junfa Mao. Fast Analytic Electromigration Analysis for General Multisegment Interconnect Wires. IEEE Trans. VLSI Syst., 28(2):421-432, 2020. [doi]

Abstract

Abstract is missing.