Wei-Chou Chen, Shian-Shyong Tseng, Ching-Yao Wang. A Novel Manufacturing Defect Detection Method Using Data Mining Approach. In Robert Orchard, Chunsheng Yang, Moonis Ali, editors, Innovations in Applied Artificial Intelligence, 17th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2004, Ottawa, Canada, May 17-20, 2004. Proceedings. Volume 3029 of Lecture Notes in Computer Science, pages 77-86, Springer, 2004.
Abstract is missing.