Ching-Yi Chen, Cheng-Wen Wu. An adaptive code rate EDAC scheme for random access memory. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 735-740, IEEE, 2010. [doi]
@inproceedings{ChenW10-0,
title = {An adaptive code rate EDAC scheme for random access memory},
author = {Ching-Yi Chen and Cheng-Wen Wu},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5456955},
researchr = {https://researchr.org/publication/ChenW10-0},
cites = {0},
citedby = {0},
pages = {735-740},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}