Yu-Guang Chen, Tao Wang, Kuan-Yu Lai, Wan-yu Wen, Yiyu Shi, Shih-Chieh Chang. Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-6, ACM, 2014. [doi]
Abstract is missing.