Hung-kai Chen, Chih-hu Wang, Chau-chin Su. A Self Calibrated ADC BIST Methodology. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 117-122, IEEE Computer Society, 2002. [doi]
Abstract is missing.