Random Positional Deviations Correction for Each LED via ePIE in Fourier Ptychographic Microscopy

Sining Chen, Tingfa Xu, Jizhou Zhang, Xing Wang, Yizhou Zhang. Random Positional Deviations Correction for Each LED via ePIE in Fourier Ptychographic Microscopy. IEEE Access, 6:33399-33409, 2018. [doi]

Abstract

Abstract is missing.