Weida Chen, Yongxin Zhu, Xinyi Liu, Xinyang Li, Dongyu Ou. Combining the histogram method and the ultrafast segmented model identification of linearity errors algorithm for ADC linearity testing. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-2, IEEE, 2016. [doi]
Abstract is missing.