Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu. Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 225-230, IEEE Computer Society, 2001. [doi]
Abstract is missing.