Optimal Redundancy Designs for CNFET-Based Circuits

Da Cheng, Fangzhou Wang, Feng Gao, Sandeep K. Gupta. Optimal Redundancy Designs for CNFET-Based Circuits. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 25-32, IEEE Computer Society, 2014. [doi]

Abstract

Abstract is missing.