Min Woo Cheon, Tae Gon Kim, Dae-Hwan Youn, Ki Won Nam, Chang-Su Na, Young-Eok Kim, Jung-Chul Lee. Comparison of Temperature in the Deep Part of the Dummy by the Electronic Moxibustion and the Gu-Gwan Moxibustion. In James Jong Hyuk Park, Jongsung Kim, Deqing Zou, Yang-Sun Lee, editors, Information Technology Convergence, Secure and Trust Computing, and Data Management - ITCS 2012 & STA 2012, Gwangju, Korea, September 6-8, 2012. Volume 180 of Lecture Notes in Electrical Engineering, pages 35-40, Springer, 2012. [doi]
Abstract is missing.