Chen-Yong Cher, Yiorgos Makris, C. Thibeault, Alan J. Drake. Innovative practices session 7C: Self-calibration & trimming. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1, IEEE Computer Society, 2013. [doi]
Abstract is missing.