Improving scan chain diagnostic accuracy using multi-stage artificial neural networks

Mason Chern, Shih-Wei Lee, Shi-Yu Huang, Yu Huang, Gaurav Veda, Kun-Han Hans Tsai, Wu-Tung Cheng. Improving scan chain diagnostic accuracy using multi-stage artificial neural networks. In Toshiyuki Shibuya, editor, Proceedings of the 24th Asia and South Pacific Design Automation Conference, ASPDAC 2019, Tokyo, Japan, January 21-24, 2019. pages 341-346, ACM, 2019. [doi]

Abstract

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